Applications of SR-TXRF Analysis in XAS
Synchrotron radiation induced Total reflection X-Ray Fluorescence (SR-TXRF) analysis is a micro-analytical technique which offers detection limits in the femtogram range for most elements. The technique can be coupled with X-ray Absorption Near Edge Structure (XANES) spectroscopy to gain information on the chemical environment of specific elements of interest at an ultra trace level. The combination of these techniques has ...